Scan-Cell Reordering for Minimizing Scan-Shift Power Based on Nonspecified Test Cubes
نویسندگان
چکیده
منابع مشابه
Scan Cell Reordering for Peak Power Reduction during Scan Test Cycles
Scan technology increases the switching activity well beyond that of the functional operation of an IC. In this paper, we first discuss the issues of excessive peak power during scan testing and highlight the importance of reducing peak power particularly during the test cycle (i.e. between launch and capture) so as to avoid noise phenomena such as IR-drop or Ground Bounce. Next, we propose a s...
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ژورنال
عنوان ژورنال: ACM Transactions on Design Automation of Electronic Systems
سال: 2010
ISSN: 1084-4309,1557-7309
DOI: 10.1145/1870109.1870119